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Home  >>  Products  >>  pH & Conductivity  >>  Sigmascope SMP350

Sigmascope® SMP350 Electrical Conductivity Gauge


The Sigmascope® SMP350 Electrical Conductivity Gauge measures the electrical conductivity of nonferrous metals. Electrical conductivity is an important material property that provides information not only about a metal's ability to conduct electrical currents but also about its composition, micro structure and/or mechanical properties. Using the SIGMASCOPE® SMP350, it is easy and quick to determine the electrical conductivity with precision and accuracy.

Sigmascope Conductivity Gauge



Measurement Principle - The SIGMASCOPE® SMP350 measures the electrical conductivity using the phase-sensitive eddy current method, which is approved by both DIN EN 2004-1 and ASTM E 1004 for determining conductivity. This kind of signal evaluation allows for contact-free determination of a substrate's electrical conductivity, even under paint or plastic coatings up to 500 µm thick. This method also minimizes the influence of surface roughness.

  • Windows™ CE operating system; large touchscreen with keyboard
  • Customizable user interface
  • Very simple calibration via user prompts
  • Simple management of measuring applications with user-definable file and folder structure
  • Memory for several thousand measuring applications and several thousand readings
  • Consideration of each material's conductivity-related temperature coefficient
  • Automatic measurement acquisition in free-running mode or with external start
  • Graphical presentation of specification limits
  • Extensive statistical evaluation of test series with date/time stamp as well as computation of Cp, Cpk and histogram presentation
  • Manual temperature input
  • Monitoring of temperature changes over time (ΔT/Δt)
  • Calibration fine-tuning for instrument calibration with up to 4 standards
  • Acoustic signal for measurement acquisition and violation of specification limits; can be turned on/off
  • Various languages available
  • The corresponding probes are suited for different measurement frequencies. For automatic compensation of temperature influences on the measurement, the ambient or specimen temperature can be taken directly with the integrated (or optional external) temperature sensor.
  • Applications include:
    • Quality assurance and sorting of raw materials
    • Authenticating of coin alloys (e.g. specific conductivity of coins)
    • Assessing hardness and strength of heat-treated materials
    • Inspecting for heat damage, material fatigue and cracks
    • Estimating the phosphorous content in copper
    • Tracking precipitation processes, e.g. for Cu-Cr alloys
    • Testing the homogeneity of alloys
    • Scrap metal sorting

Technical Data

Technical Data
Measurements Pursuant To: ASTM E 1004 and DIN EN 2004-1
Measurement Frequencies: Ranging from 15 kHz to 1 MHz depending on the probe
Measurement Range: 0.5 - 65 MS/m or 1 - 112% IACS
Measurement Precision: At ambient temperature: ±0.5% of reading
Operating Temperature: 0 - 40°C / 32°F - 104°F
Lift-off Compensation: To 500 µm
Smallest Diameter Measurement Area Without Noticeable Influence on the Reading: 13 mm
Connector for electrical conductivity probe, with or without integrated temperature sensor
Connector for optional temperature sensor
USB communication and printer port
Power supply via battery or electric plug

Probe FS40

Fischer Probe FS40 and FS40LF
The probes measure the specific electrical conductivity of non-ferrous metals in accordance with DIN EN 2004-1 and ASTM E 1004. Because of the integrated temperature sensor all probes are suitable for temperature corrected measurements with automatic display of the conductivity value normalized to 20°C (68°F). All probes work with different frequencies and therefore are able to measure up to various material depths. The used measuring method allows contact-free measurements and measurements under non-conductive top coatings as lacquer coatings or plastic covers.
  • Material sorting
  • Inspection for heat damage and material fatigue1
  • Conclusion about the hardness and strength of heat treated materials1
  • Determination of metal purity1
  • Criterion for the quality of alloys1
  • Assessment of thermal sprayed coatings1
  • FS40LF, additional featured for testing the authenticity of coin alloys and small precious bullions1

1 Such applications are based solely on specific empirical values

Probe FS40 Technical Data
Probe Design: Axial single tip probes with spring-loaded measuring system
Applications: Determination the electrical conductivity of non-ferrous metals (NF)
Measurement Range: 5... 108 %IACS
Probe Frequency: 60 kHz, 120 kHz, 240 kHz & 480 kHz
Trueness: Trueness 1...100 %IACS: ≤ 2 % of nominal value
Based on Fischer factory calibration standards with +20°C (+68°F) material temperature
Repeatability Precision: Depending on probe frequency
60 kHz: ≤ 0.10 %IACS of reading
120 kHz: ≤ 0.15 %IACS of reading
240 kHz: ≤ 0.20 %IACS of reading
480 kHz: ≤ 0.35 %IACS of reading
Based on Fischer factory calibration standards, 5 single readings per standard, standard with +20°C material temperature
Influences: Depending on material and used probe frequency - The following values are valid for a sufficient material thickness which depends on the used probe frequency
Material Thickness Th:
No measurement deviation within the trueness for Th ≥ Thmin Depending on the electrical conductivity of the material the minimal material thickness Thmin can be computed according to the following equation:
equation f = Probe frequency in Hz
σ = Electrical conductivity of the material in %IACS
K ≈ 0.9, specific probe factor
Examples Depending on probe frequency
460 kHz: ≤ 0.10 %IACS of reading
120 kHz: ≤ 0.15 %IACS of reading
240 kHz: ≤ 0.20 %IACS of reading
480 kHz: ≤ 0.35 %IACS of reading
Edge Distance (R), Specification From Probe Tip Centre: For all probe frequencies- No measurement error within the trueness as of R ≥ 7 mm / 0.28" - Probe needs a minimum of R = 7 mm / 0.28"
Edge Distance Measuring spot in the centre of the circular surface
Edge Distance (X), Specification From Probe Tip Centre: For all probe frequencies - No measurement error within the trueness as of X ≥ 7 mm / 0.28"
Measuring spot Edge Distance X
Curvature (R), measurement deviation from the nominal value with reference to master calibration on flat surface: For 60, 120, 240, 480 kHz

Compensation of curvature for R = 3...50 mm (0.12...1.97" ) by entering the diameter of curvature into the instrument No measurement error within the trueness as of R ≥ 50 mm / 1.97"
Measurement with measurement prism (grip ring 2) from the scope of supply. Probe needs a minimum of R = 1 mm / 0.04" Measurement deviation
Distance Compensation (Measurement through a lacquer or plastic coating):

Thickness of an air gab, plastic foil or lacquer coating. Distance compensated up to a thickness of 500 µm / 0.02" max. error: 1 % of reading

Valid for measuring range - 0.5...108 %IACS
Admissible Ambient Temperature at Operation: -10°C...+40°C / +14°F...+104°F
Surface Temperature: max. +40≥C / +104°F
Humidity Protection: No
Probe Tip Material: Plastic
Probe Tip Replaceable: No
Measuring Method: Phase sensitive eddy current method
Scope of Supply: Probe, measurement prism (grip ring 2), Cu standard approx. 100 %IACS
Dimensions: Cable length: 1.5 m / 59.06", other cable lengths on request
Probe Dimensions



Prices subject to change    Prices listed in US dollars for domestic shipments within US, Canada, & Mexico only    Export orders require quotations - click here for a quote     For more info call us 1-800-762-2478 or 954-946-9454.
Item Number Item Prices

Carry Case, Power Supply, Battery Set, Carrying strap, Protective cover for instrument, Cu Reference Standard, USB Cable, FS40 Probe
CD-814103 SIGMASCOPE® SMP350 with FS40 Probe $6,493.00


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