Gardco :: Sigmascope SMP350

Features

Windows™ CE operating system; large touchscreen with keyboard
Customizable user interface
Very simple calibration via user prompts
Simple management of measuring applications with user-definable file and folder structure
Memory for several thousand measuring applications and several thousand readings
Consideration of each material's conductivity-related temperature coefficient
Automatic measurement acquisition in free-running mode or with external start
Graphical presentation of specification limits
Extensive statistical evaluation of test series with date/time stamp as well as computation of C_p, C_pk and histogram presentation
Manual temperature input
Monitoring of temperature changes over time (ΔT/Δt)
Calibration fine-tuning for instrument calibration with up to 4 standards
Acoustic signal for measurement acquisition and violation of specification limits; can be turned on/off
Various languages available

The SIGMASCOPE® SMP350 is equipped with a Windows™ CE operating system and an intuitive graphical user interface that drives a high-resolution touchscreen operable with stylus or finger.

The corresponding probes are suited for different measurement frequencies. For automatic compensation of temperature influences on the measurement, the ambient or specimen temperature can be taken directly with the integrated (or optional external) temperature sensor.

Technical Data

Technical Data
Measurements Pursuant To:	ASTM E 1004 and DIN EN 2004-1
Measurement Frequencies:	Ranging from 15 kHz to 1 MHz depending on the probe
Measurement Range:	0.5 - 65 MS/m or 1 - 112% IACS
Measurement Precision:	At ambient temperature: ±0.5% of reading
Operating Temperature:	0 - 40°C / 32°F - 104°F
Lift-off Compensation:	To 500 µm
Smallest Diameter Measurement Area Without Noticeable Influence on the Reading:	13 mm
Connector for electrical conductivity probe, with or without integrated temperature sensor
Connector for optional temperature sensor
USB communication and printer port
Power supply via battery or electric plug

Applications

The SMP350 can measure the electrical conductivity of any non-magnetic metal. Furthermore, since the electrical conductivity provides data about other material properties, it is effective in a wide range of measuring applications and fields of use, including:

Quality assurance and sorting of raw materials
Authenticating of coin alloys (e.g. specific conductivity of coins)
Assessing hardness and strength of heat-treated materials
Inspecting for heat damage, material fatigue and cracks
Estimating the phosphorous content in copper
Tracking precipitation processes, e.g. for Cu-Cr alloys
Testing the homogeneity of alloys
Scrap metal sorting

Calibration Standards

High-precision measurements are required to determine the electrical conductivity. Because the eddy current method is a comparative measurement method, accurate standards are necessary to calibrate the measuring instrument.

Certified standards are available for the entire conductivity range. Certified standards for calibrating the SIGMASCOPE® SMP350, traceable to internationally-recognized calibration norms.

Measuring the electrical conductivity is an important element of quality assurance in the manufacture, maintenance and repair of aircraft

Probe FS24

The probes measure the specific electrical conductivity of non-ferrous metals in accordance with DIN EN 2004-1 and ASTM E 1004. Due to the small design the probes are well suited for measurements on small or narrow test areas. The temperature of the specimen have a significant effect on measurement of the electrical conductivity. We recommend to perform a corrective calibration before each series of measurements. The used measuring method allows contact-free measurements and measurements under non-conductive top coatings as lacquer coatings for example:

Measurements on small test areas
Material sorting
Inspection for heat damage and material fatigue¹
Conclusion about the hardness and strength of heat treated materials¹
Determination of metal purity¹
Criterion for the quality of alloys¹

¹ Such applications are based solely on specific empirical values

Technical Data
Probe Design:	Axial single tip probes with spring-loaded measuring system
Applications:	Determination the electrical conductivity of non-ferrous metals (NF)
Measurement Range:	5... 108 %IACS
Probe Frequency:	480 kHz
Trueness:	7...100 %IACS: ≤ 4 % of nominal value - based on Fischer factory calibration standards with +20 Â°C (+68 Â°F) material temperature
Repeatability Precision:	7...100 %IACS: ≤ 1 %IACS of reading - based on Fischer factory calibration standards, 5 single readings per standard, standard with +20°C (+68°F) material temperature
Influences:	Depending on material - The following values are valid for a sufficient material thickness which depends on the electrical conductivity of the material.
Material Thickness Th:	No measurement deviation within the trueness for Th ≥ Th _min Depending on the electrical conductivity of the material the minimal material thickness Th_min can be computed according to the following equation:
		f = Probe frequency in Hz σ = Electrical conductivity of the material in %IACS
	Examples: Probe frequency 480 kHz 0.28 mm for 100 %IACS (Cu) 0.40 mm for 51.7 %IACS (Al) 2.17 mm for 1.72 %IACS
Edge Distance (R), Specification From Probe Tip Centre:	Probe needs a minimum of R = 1.7 mm / R = 0.07" (support stand necessary)
		Measuring spot in the centre of the circular surface
Edge Distance (X), Specification From Probe Tip Centre:	No measurement deviation within the trueness for X ≥ 3.7 mm / X ≥ 0.16" Measurement deviation ≥ 10 % for X ≤ 0.8 mm / X ≥ 0.03"
	Measuring spot
Curvature (R), measurement deviation from the nominal value with reference to master calibration on flat surface:	Measurement deviation ≥ 10 % for R ≥ 3.5 mm / R ≥ 0.14" - Probe needs a minimum of R = 1 mm / R = 0.04" (support stand necessary)
	Measuring spot
Distance Compensation (Measurement through a lacquer or plastic coating):	Thickness of an air gab or lacquer coating 0 ... 200 Î¼m / 0 ... 0.008" - Max. error: 3 % of reading
Admissible Ambient Temperature at Operation:	-10 °C...+40 °C / +14 °Fâ€¦+104 °F
Surface Temperature:	max. +40 °C / +104 °F
Humidity Protection:	Yes
Probe Tip Material:	Ceramic
Probe Tip Replaceable:	No
Measuring Method:	Phase sensitive eddy current method
Scope of Supply:	Probe, Cu standard approx. 100 %IACS
Adapter for Support Stand:	602-370, is supplied by default with the support stand
Dimensions:	Cable length: 1.5 m / 59.06", other cable lengths on request

Probe FS40 and FS40LF

The probes measure the specific electrical conductivity of non-ferrous metals in accordance with DIN EN 2004-1 and ASTM E 1004. Because of the integrated temperature sensor all probes are suitable for temperature corrected measurements with automatic display of the conductivity value normalized to 20°C (68°F). All probes work with different frequencies and therefore are able to measure up to various material depths. The used measuring method allows contact-free measurements and measurements under non-conductive top coatings as lacquer coatings or plastic covers.

Material sorting
Inspection for heat damage and material fatigue¹
Conclusion about the hardness and strength of heat treated materials¹
Determination of metal purity¹
Criterion for the quality of alloys¹
Assessment of thermal sprayed coatings¹
FS40LF, additional featured for testing the authenticity of coin alloys and small precious bullions¹

¹ Such applications are based solely on specific empirical values

Probe FS40 and FS40LF Technical Data
	FS40	FS40LF
Probe Design:	Axial single tip probes with spring-loaded measuring system
Applications:	Determination the electrical conductivity of non-ferrous metals (NF)
Measurement Range:	5... 108 %IACS
Probe Frequency:	60 kHz, 120 kHz, 240 kHz & 480 kHz	15 kHz, 30 kHz, 60 kHz & 120 kHz
Trueness:	Trueness 1...100 %IACS: ≤ 2 % of nominal value	1...100 %IACS: ≤ 1 % of nominal value
	Based on Fischer factory calibration standards with +20°C (+68°F) material temperature
Repeatability Precision:	Depending on probe frequency 60 kHz: ≤ 0.10 %IACS of reading 120 kHz: ≤ 0.15 %IACS of reading 240 kHz: ≤ 0.20 %IACS of reading 480 kHz: ≤ 0.35 %IACS of reading	Depending on probe frequency 15 kHz: ≤ 0.1 %IACS of reading 130 kHz: ≤ 0.1 %IACS of reading 160 kHz: ≤ 0.1 %IACS of reading 120 kHz: ≤ 0.15 %IACS of reading
	Based on Fischer factory calibration standards, 5 single readings per standard, standard with +20°C material temperature
Influences:	Depending on material and used probe frequency - The following values are valid for a sufficient material thickness which depends on the used probe frequency
Material Thickness Th:	No measurement deviation within the trueness for Th ≥ Th_min Depending on the electrical conductivity of the material the minimal material thickness Th_min can be computed according to the following equation:
		f = Probe frequency in Hz σ = Electrical conductivity of the material in %IACS K ≈ 0.9, specific probe factor
	Examples Depending on probe frequency 460 kHz: ≤ 0.10 %IACS of reading 120 kHz: ≤ 0.15 %IACS of reading 240 kHz: ≤ 0.20 %IACS of reading 480 kHz: ≤ 0.35 %IACS of reading	Examples Depending on probe frequency 15 kHz: ≤ 0.1 %IACS of reading 130 kHz: ≤ 0.1 %IACS of reading 160 kHz: ≤ 0.1 %IACS of reading 120 kHz: ≤ 0.15 %IACS of reading
Edge Distance (R), Specification From Probe Tip Centre:	For all probe frequencies- No measurement error within the trueness as of R ≥ 7 mm / 0.28" - Probe needs a minimum of R = 7 mm / 0.28"
		Measuring spot in the centre of the circular surface
Edge Distance (X), Specification From Probe Tip Centre:	For all probe frequencies - No measurement error within the trueness as of X ≥ 7 mm / 0.28"
	Measuring spot
Curvature (R), measurement deviation from the nominal value with reference to master calibration on flat surface:	For 60, 120, 240, 480 kHz Compensation of curvature for R = 3...50 mm (0.12...1.97" ) by entering the diameter of curvature into the instrument No measurement error within the trueness as of R ≥ 50 mm / 1.97"	For 15 kHz No measurement error within the trueness as of R ≥ 48 mm / 1.89" Error ≥ 10 % for R ≥ 10.3 mm / 0.41" For 30 kHz No measurement error within the trueness as of R ≥ 45 mm / 1.77" Error ≥ 10 % for R ≥ 9.5 mm / 0.37" For 60 kHz and 120 kHz Compensation of curvature for R = 3... 50 mm (0.12...1.97") by entering the diameter of curvature into the instrument No measurement error within the trueness as of R ≥ 50 mm / 1.97"
	Measurement with measurement prism (grip ring 2) from the scope of supply. Probe needs a minimum of R = 1 mm / 0.04"
Distance Compensation (Measurement through a lacquer or plastic coating):	Thickness of an air gab, plastic foil or lacquer coating. Distance compensated up to a thickness of 500 µm / 0.02" max. error: 1 % of reading
	Valid for measuring range - 0.5...108 %IACS	Valid for measuring range - 5... 100 %IACS
Admissible Ambient Temperature at Operation:	-10°C...+40°C / +14°F...+104°F
Surface Temperature:	max. +40≥C / +104°F
Humidity Protection:	No
Probe Tip Material:	Plastic
Probe Tip Replaceable:	No
Measuring Method:	Phase sensitive eddy current method
Scope of Supply:	Probe, measurement prism (grip ring 2), Cu standard approx. 100 %IACS
Dimensions:	Cable length: 1.5 m / 59.06", other cable lengths on request

Probe FS40HF

The probes measure the specific electrical conductivity of non-ferrous metals in accordance with DIN EN 2004-1 and ASTM E 1004. Because of the integrated temperature sensor all probes are suitable for temperature corrected measurements with automatic display of the conductivity value normalized to 20°C (68°F). All probes work with high frequencies and therefore are able to measure with low material depths only. The used measuring method allows contact-free measurements and measurements under non-conductive top coatings as lacquer coatings or plastic covers.

Near-surface measurements
Measurements of thin sheets
Conclusion about the level of wear for thin coatings¹
Assessment of thermal sprayed coatings¹

¹ Such applications are based solely on specific empirical values

Probe FS40HF Technical Data
Probe Design:	Axial single tip probes with fixed measuring system
Applications:	Determination the electrical conductivity of non-ferrous metals (NF)
Measurement Range:	5 ...108 %IACS
Probe Frequency:	1000 kHz and 2000 kHz
Trueness:	1... 100 %IACS: ≤ 1 % of nominal value
Repeatability Precision:	1000 kHz: ≤ 0.35 %IACS of reading 2000 kHz: ≤ 1 %IACS of reading
Influences:	Depending on material and used probe frequency
Material Thickness Th:	No measurement deviation within the trueness for Th ≥ Th _min Depending on the electrical conductivity of the material the minimal material thickness Th_min can be computed according to the following equation:
		f = Probe frequency in Hz σ = Electrical conductivity of the material in %IACS K ≈ 0.9, specific probe factor
	Examples For probe frequency 1000 kHz 0.18 mm (0.007") for 100 %IACS (Cu) 0.25 mm (0.010") for 51.7 %IACS (Al) 1.35 mm (0.053") for 1.72 %IACS
Edge Distance (R), Specification From Probe Tip Centre:	For all probe frequencies - No measurement error within the trueness as of R â‰¥ 7 mm / 0.28" Probe needs a minimum of R = 7 mm / 0.28"
		Measuring spot in the centre of the circular surface
Edge Distance (X), Specification From Probe Tip Centre:	For all probe frequencies. No measurement error within the trueness as of X ≥ 7 mm / 0.28"
	Measuring spot
Curvature (R), measurement deviation from the nominal value with reference to master calibration on flat surface:	For 1000 and 2000 kHz Measurement error ≥ 10 % for R ≤ 12.5 mm / 0.49". Probe needs a minimum of R = 1 mm / 0.04"
	Measuring spot
Distance Compensation (Measurement through a lacquer or plastic coating):	0â€¦500 Î¼m / 19.54" Max. Measurement deviation: 2 % of reading, Thickness of an air gab, plastic foil or lacquer coating.
Admissible Ambient Temperature at Operation:	-10°C...+40°C / +14°F...+104°F
Surface Temperature:	max. +40°C / +104°F
Humidity Protection:	No
Probe Tip Material:	Plastic
Probe Tip Replaceable:	No
Measuring Method:	Phase sensitive eddy current method
Scope of Supply:	Probe, measurement prism (grip ring 2), Cu standard approx. 100 %IACS
Dimensions:	Cable length: 1.5 m / 59.06", other cable lengths on request

Sigmascope® SMP350

Features

Technical Data

Applications

Calibration Standards

Probe FS24

Probe FS40 and FS40LF

Probe FS40HF

Prices