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| Measuring the Electrical Conductivity of Nonferrous Metals |
Electrical conductivity is an important material property
that provides information not only about a metal's ability to
conduct electrical currents but also about its composition,
micro structure and/or mechanical properties. Using the
SIGMASCOPE® SMP350, it is easy and quick to determine
the electrical conductivity with precision and accuracy.
Measurement Principle - The SIGMASCOPE® SMP350 measures the electrical
conductivity using the phase-sensitive eddy current
method, which is approved by both DIN EN 2004-1 and
ASTM E 1004 for determining conductivity. This kind of
signal evaluation allows for contact-free determination of
a substrate's electrical conductivity, even under paint or
plastic coatings up to 500 µm thick. This method also
minimizes the influence of surface roughness. |
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Features
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- Windows™ CE operating system; large touchscreen with keyboard
- Customizable user interface
- Very simple calibration via user prompts
- Simple management of measuring applications with user-definable file and folder structure
- Memory for several thousand measuring applications and several thousand readings
- Consideration of each material's conductivity-related temperature coefficient
- Automatic measurement acquisition in free-running mode or with external start
- Graphical presentation of specification limits
- Extensive statistical evaluation of test series with date/time stamp as well as computation of Cp, Cpk and histogram presentation
- Manual temperature input
- Monitoring of temperature changes over time (ΔT/Δt)
- Calibration fine-tuning for instrument calibration with up to 4 standards
- Acoustic signal for measurement acquisition and violation of specification limits; can be turned on/off
- Various languages available
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Technical Data
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| Technical Data |
| Measurements Pursuant To: |
ASTM E 1004 and DIN EN 2004-1 |
| Measurement Frequencies: |
Ranging from 15 kHz to 1 MHz depending on the probe |
| Measurement Range: |
0.5 - 65 MS/m or 1 - 112% IACS |
| Measurement Precision: |
At ambient temperature: ±0.5% of reading |
| Operating Temperature: |
0 - 40°C / 32°F - 104°F |
| Lift-off Compensation: |
To 500 µm |
| Smallest Diameter Measurement Area Without Noticeable Influence on the Reading: |
13 mm |
| Connector for electrical conductivity probe, with or without integrated temperature sensor |
| Connector for optional temperature sensor |
| USB communication and printer port |
| Power supply via battery or electric plug |
Applications
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The SMP350 can measure the electrical conductivity of any non-magnetic metal. Furthermore, since
the electrical conductivity provides data about other material properties, it is effective in a wide range of
measuring applications and fields of use, including:
• Quality assurance and sorting of raw materials
• Authenticating of coin alloys (e.g. specific conductivity of coins)
• Assessing hardness and strength of heat-treated materials
• Inspecting for heat damage, material fatigue and cracks
• Estimating the phosphorous content in copper
• Tracking precipitation processes, e.g. for Cu-Cr alloys
• Testing the homogeneity of alloys
• Scrap metal sorting
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Hardware
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The SIGMASCOPE® SMP350 is equipped with a
Windows™ CE operating system and an intuitive
graphical user interface that drives a high-resolution
touchscreen operable with stylus or finger.
The
corresponding probes are suited for different
measurement frequencies. For automatic compensation
of temperature influences on the measurement, the
ambient or specimen temperature can be taken directly
with the integrated (or optional external) temperature
sensor. |
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Calibration Standards
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High-precision measurements are
required to determine the electrical
conductivity. Because the eddy
current method is a comparative
measurement method, accurate
standards are necessary to calibrate
the measuring instrument.
Certified
standards are available for the entire
conductivity range. Certified standards for calibrating the
SIGMASCOPE® SMP350, traceable
to internationally-recognized
calibration norms.
Measuring the electrical conductivity is an important element of quality assurance in the manufacture, maintenance and repair of aircraft |
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Probe FS24
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| The probes measure the specific electrical conductivity of non-ferrous metals in accordance with DIN
EN 2004-1 and ASTM E 1004. Due to the small design the probes are well suited for measurements on
small or narrow test areas. The temperature of the specimen have a significant effect on measurement
of the electrical conductivity. We recommend to perform a corrective calibration before each series of
measurements. The used measuring method allows contact-free measurements and measurements
under non-conductive top coatings as lacquer coatings for example: |
- Measurements on small test areas
- Material sorting
- Inspection for heat damage and material fatigue1
- Conclusion about the hardness and strength of heat treated materials1
- Determination of metal purity1
- Criterion for the quality of alloys1
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| 1 Such applications are based solely on specific empirical values |
| Technical Data |
| Probe Design: |
Axial single tip probes with spring-loaded measuring system |
| Applications: |
Determination the electrical conductivity of non-ferrous metals (NF) |
| Measurement Range: |
5... 108 %IACS |
| Probe Frequency: |
480 kHz |
| Trueness: |
7...100 %IACS: ≤ 4 % of nominal value - based on Fischer factory calibration standards with +20 °C (+68 °F) material temperature |
| Repeatability Precision: |
7...100 %IACS: ≤ 1 %IACS of reading - based on Fischer factory calibration standards, 5 single readings per standard, standard with +20°C (+68°F) material temperature |
| Influences: |
Depending on material -
The following values are valid for a sufficient material thickness which depends on the electrical conductivity of
the material. |
Material Thickness Th:
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No measurement deviation within the trueness for Th ≥ Th min Depending on the electrical conductivity of the material the minimal
material thickness Thmin can be computed according to the following
equation: |
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f = Probe frequency in Hz
σ = Electrical conductivity of the
material in %IACS |
Examples: Probe frequency 480 kHz
0.28 mm for 100 %IACS (Cu)
0.40 mm for 51.7 %IACS (Al)
2.17 mm for 1.72 %IACS |
| Edge Distance (R), Specification
From Probe Tip Centre: |
Probe needs a minimum of R = 1.7 mm / R = 0.07" (support stand necessary) |
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Measuring spot in the centre of
the circular surface |
| Edge Distance (X), Specification
From Probe Tip Centre: |
No measurement deviation within the trueness for X ≥ 3.7 mm / X ≥ 0.16" Measurement deviation ≥ 10 % for X ≤ 0.8 mm / X ≥ 0.03" |
| Measuring spot |
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| Curvature (R), measurement
deviation from the nominal
value with reference to master
calibration on flat surface: |
Measurement deviation ≥ 10 % for R ≥ 3.5 mm / R ≥ 0.14" -
Probe needs a minimum of R = 1 mm / R = 0.04" (support stand necessary) |
| Measuring spot |
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| Distance Compensation (Measurement through a lacquer or plastic coating): |
Thickness of an air gab or lacquer coating 0 ... 200 μm / 0 ... 0.008" - Max. error: 3 % of reading |
| Admissible Ambient Temperature at Operation: |
-10 °C...+40 °C / +14 °F…+104 °F |
| Surface Temperature: |
max. +40 °C / +104 °F |
| Humidity Protection: |
Yes |
| Probe Tip Material: |
Ceramic |
| Probe Tip Replaceable: |
No |
| Measuring Method: |
Phase sensitive eddy current method |
| Scope of Supply: |
Probe, Cu standard approx. 100 %IACS |
| Adapter for Support Stand: |
602-370, is supplied by default with the support stand
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| Dimensions: |
Cable length: 1.5 m / 59.06", other cable lengths on request |
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Probes FS40 and FS40LF
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| The probes measure the specific electrical conductivity of non-ferrous metals in accordance with DIN
EN 2004-1 and ASTM E 1004. Because of the integrated temperature sensor all probes are suitable for
temperature corrected measurements with automatic display of the conductivity value normalized to 20°C (68°F). All probes work with different frequencies and therefore are able to measure up to various
material depths. The used measuring method allows contact-free measurements and measurements
under non-conductive top coatings as lacquer coatings or plastic covers. |
- Material sorting
- Inspection for heat damage and material fatigue1
- Conclusion about the hardness and strength of heat treated materials1
- Determination of metal purity1
- Criterion for the quality of alloys1
- Assessment of thermal sprayed coatings1
- FS40LF, additional featured for testing the authenticity of coin alloys and small precious bullions1
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| 1 Such applications are based solely on specific empirical values |
| Probe FS40 and FS40LF Technical Data |
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FS40 |
FS40LF |
| Probe Design: |
Axial single tip probes with spring-loaded measuring system |
| Applications: |
Determination the electrical conductivity of non-ferrous metals (NF) |
| Measurement Range: |
5... 108 %IACS |
| Probe Frequency: |
60 kHz, 120 kHz, 240 kHz & 480 kHz |
15 kHz, 30 kHz, 60 kHz & 120 kHz |
| Trueness: |
Trueness 1...100 %IACS: ≤ 2 % of nominal value |
1...100 %IACS: ≤ 1 % of nominal value |
| Based on Fischer factory calibration standards with +20°C (+68°F) material temperature |
| Repeatability Precision: |
Depending on probe frequency
60 kHz: ≤ 0.10 %IACS of reading
120 kHz: ≤ 0.15 %IACS of reading
240 kHz: ≤ 0.20 %IACS of reading
480 kHz: ≤ 0.35 %IACS of reading |
Depending on probe frequency
15 kHz: ≤ 0.1 %IACS of reading
130 kHz: ≤ 0.1 %IACS of reading
160 kHz: ≤ 0.1 %IACS of reading
120 kHz: ≤ 0.15 %IACS of reading |
| Based on Fischer factory calibration standards, 5 single readings per standard, standard with +20°C material temperature |
| Influences: |
Depending on material and used probe frequency - The following values are valid for a sufficient material thickness which depends on the used probe frequency |
Material Thickness Th:
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No measurement deviation within the trueness for Th ≥ Thmin Depending on the electrical conductivity of the material the minimal
material thickness Thmin can be computed according to the following
equation: |
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f = Probe frequency in Hz
σ = Electrical conductivity of the material in %IACS
K ≈ 0.9, specific probe factor |
Examples Depending on probe frequency
460 kHz: ≤ 0.10 %IACS of reading
120 kHz: ≤ 0.15 %IACS of reading
240 kHz: ≤ 0.20 %IACS of reading
480 kHz: ≤ 0.35 %IACS of reading
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Examples Depending on probe frequency
15 kHz: ≤ 0.1 %IACS of reading
130 kHz: ≤ 0.1 %IACS of reading
160 kHz: ≤ 0.1 %IACS of reading
120 kHz: ≤ 0.15 %IACS of reading |
| Edge Distance (R), Specification
From Probe Tip Centre: |
For all probe frequencies-
No measurement error within the trueness as of R ≥ 7 mm / 0.28" - Probe needs a minimum of R = 7 mm / 0.28" |
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Measuring spot in the centre of
the circular surface |
| Edge Distance (X), Specification
From Probe Tip Centre: |
For all probe frequencies -
No measurement error within the trueness as of X ≥ 7 mm / 0.28" |
| Measuring spot |
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| Curvature (R), measurement
deviation from the nominal
value with reference to master
calibration on flat surface: |
For 60, 120, 240, 480 kHz
Compensation of curvature for R = 3...50 mm (0.12...1.97" ) by entering the
diameter of curvature into the
instrument
No measurement error within the
trueness as of R ≥ 50 mm / 1.97" |
For 15 kHz
No measurement error within the trueness
as of R ≥ 48 mm / 1.89"
Error ≥ 10 % for R ≥ 10.3 mm / 0.41"
For 30 kHz
No measurement error within the
trueness as of R ≥ 45 mm / 1.77"
Error ≥ 10 % for R ≥ 9.5 mm / 0.37"
For 60 kHz and 120 kHz
Compensation of curvature for R = 3...
50 mm (0.12...1.97") by entering the
diameter of curvature into the instrument
No measurement error within the
trueness as of R ≥ 50 mm / 1.97" |
| Measurement with measurement
prism (grip ring 2) from the
scope of supply. Probe needs a minimum of R = 1 mm / 0.04" |
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| Distance Compensation (Measurement through a lacquer or plastic coating): |
Thickness of an air gab, plastic foil or lacquer coating.
Distance compensated up to a thickness of 500 µm / 0.02" max. error: 1
% of reading |
| Valid for measuring range -
0.5...108 %IACS |
Valid for measuring range -
5... 100 %IACS |
| Admissible Ambient Temperature at Operation: |
-10°C...+40°C / +14°F...+104°F |
| Surface Temperature: |
max. +40≥C / +104°F |
| Humidity Protection: |
No |
| Probe Tip Material: |
Plastic |
| Probe Tip Replaceable: |
No |
| Measuring Method: |
Phase sensitive eddy current method |
| Scope of Supply: |
Probe, measurement prism (grip ring 2), Cu standard approx. 100 %IACS |
| Dimensions: |
Cable length: 1.5 m / 59.06", other cable lengths on request |
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Probe FS40HF
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| The probes measure the specific electrical conductivity of non-ferrous metals in accordance with DIN
EN 2004-1 and ASTM E 1004. Because of the integrated temperature sensor all probes are suitable for
temperature corrected measurements with automatic display of the conductivity value normalized to 20°C (68°F). All probes work with high frequencies and therefore are able to measure with low material
depths only. The used measuring method allows contact-free measurements and measurements under
non-conductive top coatings as lacquer coatings or plastic covers. |
- Near-surface measurements
- Measurements of thin sheets
- Conclusion about the level of wear for thin coatings1
- Assessment of thermal sprayed coatings1
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| 1 Such applications are based solely on specific empirical values |
| Probe FS40HF Technical Data |
| Probe Design: |
Axial single tip probes with fixed measuring system |
| Applications: |
Determination the electrical conductivity of non-ferrous metals (NF) |
| Measurement Range: |
5 ...108 %IACS |
| Probe Frequency: |
1000 kHz and 2000 kHz |
| Trueness: |
1... 100 %IACS: ≤ 1 % of nominal value |
| Repeatability Precision: |
1000 kHz: ≤ 0.35 %IACS of reading
2000 kHz: ≤ 1 %IACS of reading |
| Influences: |
Depending on material and used probe frequency
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Material Thickness Th:
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No measurement deviation within the trueness for Th ≥ Th min Depending on the electrical conductivity of the material the minimal
material thickness Thmin can be computed according to the following
equation: |
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f = Probe frequency in Hz
σ = Electrical conductivity of the material in %IACS
K ≈ 0.9, specific probe factor |
Examples For probe frequency 1000 kHz
0.18 mm (0.007") for 100 %IACS (Cu)
0.25 mm (0.010") for 51.7 %IACS (Al)
1.35 mm (0.053") for 1.72 %IACS |
| Edge Distance (R), Specification
From Probe Tip Centre: |
For all probe frequencies - No measurement error within the trueness as of R ≥ 7 mm / 0.28"
Probe needs a minimum of R = 7 mm / 0.28" |
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Measuring spot in the centre of
the circular surface |
| Edge Distance (X), Specification
From Probe Tip Centre: |
For all probe frequencies. No measurement error within the trueness as of X ≥ 7 mm / 0.28" |
| Measuring spot |
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| Curvature (R), measurement
deviation from the nominal
value with reference to master
calibration on flat surface: |
For 1000 and 2000 kHz
Measurement error ≥ 10 % for
R ≤ 12.5 mm / 0.49".
Probe needs a minimum of R = 1 mm / 0.04" |
| Measuring spot |
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| Distance Compensation (Measurement through a lacquer or plastic coating): |
0…500 μm / 19.54" Max. Measurement deviation:
2 % of reading,
Thickness of an air gab, plastic foil or lacquer coating. |
| Admissible Ambient Temperature at Operation: |
-10°C...+40°C / +14°F...+104°F |
| Surface Temperature: |
max. +40°C / +104°F |
| Humidity Protection: |
No |
| Probe Tip Material: |
Plastic |
| Probe Tip Replaceable: |
No |
| Measuring Method: |
Phase sensitive eddy current method |
| Scope of Supply: |
Probe, measurement prism (grip ring 2), Cu standard approx. 100 %IACS |
| Dimensions: |
Cable length: 1.5 m / 59.06", other cable lengths on request |
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Prices
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Prices subject to change  Prices listed in US dollars for domestic shipments within US, Canada, & Mexico only Export orders require quotations - click here for a quote For more info call us 1-800-762-2478 or 954-946-9454. |
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| Item Number |
Item |
Prices |
| Carry Case, Power Supply,
Battery Set, Carrying strap,
Protective cover for instrument,
Cu Reference Standard,
USB Cable, FS40 Probe |
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| CD-814103 |
SIGMASCOPE® SMP350 with FS40 Probe |
$5,795.00 |
| CD-814121 |
Measurement Probe FS24 |
1,877.00 |
| CD-814123 |
Measurement Probe FS40 |
1,995.00 |
| CD-814125 |
Measurement Probe FS40HF |
2,500.00 |
| CD-814127 |
Measurement Probe FS40LF |
2,500.00 |
| Optional Accessories |
| CD-8147 |
Temperature Sensor |
$445.00 |
| CD-814133 |
Rechargeable Battery Set |
79.00 |
| CD-814137 |
Plug-in Power Supply |
149.00 |
| Calibration Standards |
| CD-8121 |
CAL-S SMP A| 2024/T3511, 29.3% IACS |
$302.00 |
| CD-8122 |
CAL-S SMP A| 7175/T7351, 37.9% IACS |
302.00 |
| CD-8123 |
CAL-S SMP AlMgSi F32, 48.3% IACS |
302.00 |
| CD-8124 |
CAL-S SMP Al 99.5, 58% IACS |
302.00 |
| CD-8125 |
CAL-S SMP Cu 58 MS/m, 100% IACS with Certificate |
302.00 |
| CD-8126 |
CAL-S SMP Titanium LT31, 1% IACS |
302.00 |
| CD-8127 |
CAL-S SMP Nickel silver, 8.6% IACS with Certificate |
302.00 |
| CD-8128 |
CAL-S SMP Bronze, 15.5% IACS |
302.00 |
| CD-8129 |
CAL-S SMP Brass, 26.0% IACS |
302.00 |
| CD-8131 |
CAL-S SMP NORDIC GOLD, 16.5% IACS |
302.00 |
| CD-8132 |
CAL-S SMP Manganin, 4.0% |
302.00 |
| *Sigmascope® is a registered trademark of Fischer Technology |
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