The PosiTector Replica Tape Reader gages measure and record surface profile parameters using replica tape. For use with Testex™ Press-O-Film™ Replica Tape - Digital spring micrometer measures and records peak to valley surface profile height using replica tape.
|Range:||20-115 µm (0.8 - 4.5 mils)|
|Accuracy:||±5 µm (±0.2 mils)|
|Resolution:||1 µm (0.1 mil)|
|Measuring Range:||(H)||20 - 115 µm / 0.8 - 4.5 mils|
|(Rt)||10 - 115 µm / 0.4 - 4.5 mils|
|Minimum Roughness (Ra):||2 µm / 0.08 mil|
|Accuracy:||(H)||+5 µm / +0.2 mil|
|(Rt)*||+(5 µm + 5%) / +(0.2 mil+ 5%)|
|(Ra)*||+(0.25 µm + 5%) / +(0.01 mil + 5%)|
|Anvil Pressure:||1.1 Newtons / 110 grams-force|
|Anvil Size:||Ø6.25 mm / Ø0.25 inch|
|Field of View:||3.8 x 3.8 mm / 0.149 x 0.149 inch|
|Lateral Sampling:||3.7 µm 0.145 mil|
|Vertical Resolution:||100 nm - 2D/3D|
10 nm - SDF
3.93 µin - 2D/3D
0.393 µin - SDF
|Resolution:||0.1 µm 0.01 mil|
2D Parameters - 'R' - Profile Parameters:
|Ra Roughness Average|
Rq Root mean square roughness
Rp Maximum Profile Peak Height
Rv Maximum Profile Valley Depth
Rt Total Profile Height
Rz Average Maximum Height of the Profile
Rpc Peak Count per unit length
3D Parameters - 'S' - Height/Amplitude:
|H Average maximum peak-to-valley height|
Sa Average roughness
Sq Root mean square roughness
Sz Maximum area peak-to-valley height
Sp Maximum area peak height
Sv Maximum valley depth
Spd Areal peak density
|* When measured using Optical Grade X-Coarse Replica Tape|
Linearized Peak Height
Two grades of Testex™ Press-O-Film™ replica tape, “Coarse” and "X-Coarse", are available to span the primary range of surface profiles for the coatings and linings industry –– 20 to 115 µm / 0.8 to 4.5 mils.
An unfortunate characteristic of replica tape is that conventional spring micrometer measurements are most accurate near the middle of each grade's range and least accurate at the outer ends of each grade's range. That is why two other grades, Coarse Minus (< 20 µm / 0.8 mils) and X-Coarse Plus (> 115 µm / 4.5 mils), are used to check and, if necessary, adjust measurements at the upper and lower ends of the primary range.
Inside the primary range, Coarse and X-Coarse tape share a 38 - 64 μm (1.5 - 2.5 mils) "overlap" region. Measurements with conventional micrometers require a complicated and time consuming procedure of averaging one reading using Coarse grade and one reading using X-Coarse grade to achieve reasonable accuracy.
With a single measurement, the PosiTector RTR H produces a more accurate peak-to-valley height measurement HL from Coarse or X-Coarse tapes that has been adjusted for their non-linearity. There is no need to average two or more replicas from different grades of tape AND there is no need to subtract the 50.8 μm / 2 mils of incompressible polyester film. The advantages are a reduction in measurement uncertainty, inspector workload, likelihood of error, and the number of replicas needed by inspectors to assure accuracy.
The PosiTector RTR H can also display a height value (H) that is comparable to what conventional analog spring micrometers would display after the 50.8 μm / 2 mils of incompressible polyester film has been subtracted.
ASTM D 4417, ISO 8503-5, NACE RP287, SSPC-PA 17, SSPC-SP5, SP6, SP10, SP11-87T and others
ASME B46, ASTM D4417, ISO 8503-5, NACE SP287, SSPC-PA 17, SSPC-SP5, SP6, SP10, SP11-87T and others